New York – 3-D Technology To Be Tested For Carry-on Bags At JFK Airport

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    FILE - Baggage and a laptop are scanned at Terminal 4 of JFK airport in New York City, U.S., May 17, 2017. REUTERS/Joe PenneyNew York – Travelers at John F. Kennedy Airport in New York will soon experience a test of more advanced, three-dimensional imaging to screen carry-on bags.

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    The Transportation Security Administration and American Airlines said Thursday that a test of computed-tomography scanners will start later this month at JFK’s Terminal 8.

    The machines let screeners manipulate 3-D images to get a better idea of what’s inside a bag.

    TSA has been running similar tests in Phoenix and Boston since last year.

    TSA uses 3-D imaging to scan checked bags, but until recently the scanners have been too large and heavy for use at security checkpoints. Instead, screeners use older X-ray technology to inspect carry-on bags.

    TSA Administrator David Pekoske says 3-D scanning will improve security right away.


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    5 years ago

    Ladies, the TSA will now always know what brand of tampons you use.